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AS6081 standard
Test/Inspection Minimum Sample Size Level

Lot Size 200 or greaterDevices Lot Size 1-199 Devices(See NOTE 1)
Minimum Required Tests

Level A
Documentation and Packaging

A1
Documentation and Packaging Inspection (4.2.6.4.1) (non-destructive) All devices All devices
External Visual Inspection

A2
a. General (4.2.6.4.2.1) (non-destructive) All devices All devices
b. Detailed (4.2.6.4.2.2) (non-destructive) 122 devices 122 or all devices, whichever is less
Remarking & Resurfacing (destructive) See NOTE 2 See NOTE 2 A3
Solvent Test for Remarking (4.2.6.4.3 A) (destructive) 3 devices 3 devices
Solvent Test for Resurfacing (4.2.6.4.3 B) (destructive) 3 devices 3 devices
Radiological (X-Ray) Inspection

A4
X-Ray Inspection (4.2.6.4.4) (non-destructive) 45 devices 45 devices or all devices,whichever is less
Lead Finish Evaluation (XRF or EDS/EDX) See NOTE 3 See NOTE 3 A5
XRF (non-destructive) or EDS/EDX (destructive) (4.2.6.4.5)(Appendix C.1) 3 devices 3 devices
Delid/Decapsulation Internal Analysis (destructive) See NOTE 4 See NOTE 4 A6
Delid/Decapsulation (4.2.6.4.6) (destructive) 3 devices 3 devices
Additional Tests (as agreed between Customer and Organization)


Remarking & Resurfacing (destructive) See NOTE 2 See NOTE 2 A3 Option
Scanning Electron Microscope (4.2.6.4.3 C) (destructive) 3 devices 3 devices
Quantitative Surface Analysis (4.2.6.4.3 D) (non-destructive) 5 devices 5 devices
Thermal Testing

Level B
Thermal Cycling Test (Appendix C.2) All devices All devices
Electrical Testing

Level C
Electrical Testing (Appendix C.3) 116 devices All devices
Burn-In

Level D
Burn-In (Pre & Post) (Appendix C.4) 45 Devices 45 devices or all devices,whichever is less
Hermeticity Verification (Fine and Gross Leak)

Level E
Hermeticity Verification (Fine and Gross Leak) (Appendix C.5) All devices All devices
Scanning Acoustic Microscopy (SAM)

Level F
Scanning Acoustic Microscopy (SAM) (Appendix C.6) As specified As specified
Other

Level G
Other test/inspections As specified As specified

NOTES:

1. For very small lot sizes, less than ten (10) devices, this “destruct” test sample size may be reduced to one (1) device at the discretion of the Cognizant Engineer with Quality Assurance concurrence and Customer approval.

2. Devices for the Remarking & Resurfacing Inspection shall be selected from the Detailed External Visual Inspection lot.

3. Devices with possible lead finish anomalies shall be selected from the Detailed External Visual Inspection lot.

4. Devices for the Delid/Decapsulation Internal Analysis shall be selected from the Remarking & Resurfacing Inspection lot.


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