epc1pc8n SAT Report

Date：2024-02-29 16:52:14Views：296Author：CHUANGXIN ONLINE TESTING LAB

Sample Type: EPC1PC8N SAT testing on 50 PCS samples(#1-#50). No anomalies such as stratification were found between the substrate surface of the wafer pin frame and the plastic sealing interface of the 50 samples, SAT test passed.